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Attend_Infer_Repeat.md

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Paper

  • Title: Attend, Infer, Repeat: Fast Scene Understanding with Generative Models
  • Authors: S. M. Ali Eslami, Nicolas Heess, Theophane Weber, Yuval Tassa, Koray Kavukcuoglu, Geoffrey E. Hinton
  • Link: http://arxiv.org/abs/1603.08575
  • Tags: Neural Network, VAE, attention
  • Year: 2016

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