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🧪 Further experimental analysis functionality #132

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🧪 Further experimental analysis functionality #132

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fa43770
further packaging
daquintero Sep 17, 2024
5ea62c8
Fix package installation
daquintero Sep 17, 2024
7db7fc9
Working new structure
daquintero Sep 17, 2024
8a03bee
Do not underestimate the manifest
daquintero Sep 18, 2024
cd50feb
Plotting function working with manifest
daquintero Sep 18, 2024
b1ccf46
Rising edge catching implemented
daquintero Sep 19, 2024
bb93005
status
daquintero Sep 19, 2024
28373df
Process towards further signal analysis
daquintero Sep 19, 2024
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4 changes: 4 additions & 0 deletions MANIFEST.in
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include LICENSE
include README.md
include *.md
recursive-include piel *
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61 changes: 61 additions & 0 deletions docs/examples/08a_pcb_interposer_characterisation/08a_pcb_interposer_characterisation.py
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import piel
import piel.experimental as pe
import piel.analysis.signals.time_data as tda
from piel.models.physical.electrical import E8364A, cables
from datetime import datetime

Expand Down Expand Up @@ -637,3 +638,63 @@ def calibration_propagation_delay_experiment(
# ```

# Note that this has some limitations of revalidation and reinstantion of python classes.

# ### Extract Software-Defined Statistics from a `DataTimeSignalData`

# `piel.analysis` also provides some functionality to analyse the corresponding time-data accordingly.
#
# For example, we might want to extract only the rising edge section of one of the measured signals:

example_signal = calibration_propagation_delay_experiment_data.data.collection[
3
].dut_waveform
example_signal_measurements = (
calibration_propagation_delay_experiment_data.data.collection[3].measurements
)

help(tda.extract_rising_edges)

example_signal_rising_edge_list = tda.extract_rising_edges(
signal=example_signal, lower_threshold_ratio=0.1, upper_threshold_ratio=0.9
)

# We can, for example, plot all these signals overlaid on top of each other - easily by just offsetting to a base reference time:

offset_example_signal_rising_edge_list = tda.offset_time_signals(
example_signal_rising_edge_list
)

piel.visual.plot.signals.plot_multi_data_time_signal(
offset_example_signal_rising_edge_list
)

# We can technically also extract some statistical metrics from this data which we could use to compare with the measured statistics:

offset_example_signal_rising_edge_metrics = tda.extract_rising_edge_statistical_metrics(
offset_example_signal_rising_edge_list
)
offset_example_signal_rising_edge_metrics.table

# | | Metric | Value |
# |---:|:-------------------|------------:|
# | 0 | Value | 0.020914 |
# | 1 | Mean | 0.020914 |
# | 2 | Min | -0.108703 |
# | 3 | Max | 0.150609 |
# | 4 | Standard Deviation | 0.00727889 |
# | 5 | Count | 17 |

# We could now compare this to the metrics the oscilloscope calculated for us previously:

example_signal_measurements["pk-pk_ch2__v"].table

# | | Metric | Value |
# |---:|:-------------------|:-------------------|
# | 0 | Value | 0.274796879094793 |
# | 1 | Mean | 0.276517693380144 |
# | 2 | Min | 0.02445312536438 |
# | 3 | Max | 0.345625005150214 |
# | 4 | Standard Deviation | 0.0039634275277739 |
# | 5 | Count | 9.91k |

# We can see the measurements are approximately close enough which is pretty cool! I would still trust the device measurements more, but with this functionality it is possible to compare a given waveform to a stastistical output from a machine.
2 changes: 2 additions & 0 deletions ...risation/data/calibration_multi_frequency_through_propagation_measurement/0/instance.json
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2 changes: 2 additions & 0 deletions ...risation/data/calibration_multi_frequency_through_propagation_measurement/2/instance.json
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2 changes: 2 additions & 0 deletions ...risation/data/calibration_multi_frequency_through_propagation_measurement/3/instance.json
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8 changes: 8 additions & 0 deletions ...risation/data/calibration_multi_frequency_through_propagation_measurement/experiment.json
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Expand Down Expand Up @@ -216,6 +218,7 @@
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2 changes: 2 additions & 0 deletions ...characterisation/data/pcb_multi_frequency_through_propagation_measurement/0/instance.json
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2 changes: 2 additions & 0 deletions ...characterisation/data/pcb_multi_frequency_through_propagation_measurement/1/instance.json
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2 changes: 2 additions & 0 deletions ...characterisation/data/pcb_multi_frequency_through_propagation_measurement/3/instance.json
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Expand Down Expand Up @@ -358,6 +362,7 @@
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5 changes: 4 additions & 1 deletion .../examples/08a_pcb_interposer_characterisation/data/pcb_rf_vna_measurement/0/instance.json
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Expand Up @@ -163,6 +163,7 @@
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Expand All @@ -234,7 +237,7 @@
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Expand Down
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Expand Down Expand Up @@ -223,6 +225,7 @@
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Expand All @@ -234,7 +237,7 @@
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"measurement_configuration_list": [
{
Expand Down
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