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Yield Optimization

Idea

By removing anomalies and tightening control limits, aiming to reduce variability and improve yield.

1. Comparing ML Anomalies with Statistical Control Limits

  • Scenario 1: If ML detects anomalies outside the initial control limits (mean ± 3σ), it confirms that the limits are reasonable.
  • Scenario 2: If ML detects anomalies inside the initial control limits, it suggests that the statistical limits may need tightening.

Example:

  • Initial control limit for Parameter1: (40, 60)
  • ML detects anomalies within the range (45, 55).
  • This implies that extreme values between 40–45 and 55–60 should also be treated as risky.
  • Action: Adjust the control limits to a tighter range.

2. Data-Driven Control Limit Adjustment

  • Recalculate boundaries using only non-anomalous data.
  • Replace the traditional mean ± 3σ approach with a method based on "good data."

New Control Limit Calculation:

  • Lower Control Limit (LCL):
    [ LCL_{new} = Q1 - 1.5 \times IQR ]
  • Upper Control Limit (UCL):
    [ UCL_{new} = Q3 + 1.5 \times IQR ] where ( IQR ) (Interquartile Range) = ( Q3 - Q1 ).

3. Process Optimization Using Anomaly-Free Data

  • Refined control limits ensure tunable parameters stay within optimized boundaries.
  • This reduces process variations and improves yield.

4. Implementation in Code

  • Recalculate control limits using only non-anomalous data.
  • Optimize yield by recommending new parameter settings.

More Approach:

  • Dynamic control limits for changing processes
  • Advanced anomaly detection algorithms (e.g., DBSCAN, Autoencoders).
  • Multivariate control limits to account for parameter correlations.
    • Instead of calculating control limits for each parameter independently, use multivariate techniques to account for correlations between parameters.
    • Example: Use Principal Component Analysis (PCA) to reduce dimensionality and detect anomalies in the transformed space.
    •  from sklearn.decomposition import PCA
       pca = PCA(n_components=2)
       transformed_data = pca.fit_transform(data.iloc[:, :-1])
       iso_forest = IsolationForest(contamination=0.05, random_state=42)
       data['PCA_Anomaly'] = iso_forest.fit_predict(transformed_data) == -1
  • Bayesian optimization for direct yield maximization.
  • Clustering-based control for pattern recognition.
  • Use clustering algorithms (e.g., K-Means) to group data into clusters and identify clusters with poor yield.
  • Define control limits based on the "good" clusters.

Which Method to Choose?

  • If your process is stable: Your current method (statistical + Isolation Forest) is likely sufficient.
  • If your process is dynamic: Consider dynamic control limits or Bayesian optimization.
  • If parameters are correlated: Use multivariate techniques like PCA or clustering.
  • If you want to explore alternatives: Try DBSCAN, One-Class SVM, or Autoencoders for anomaly detection.

Note: The above steps provide a systematic approach to improve yield by leveraging ML-based anomaly detection and data-driven control limit adjustments.

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My study code for yield optimization algorithm

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