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[ESP32] Fixed the undef build failure on disabling test setup params option. #36945

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8 changes: 7 additions & 1 deletion src/platform/ESP32/CHIPDevicePlatformConfig.h
Original file line number Diff line number Diff line change
Expand Up @@ -121,7 +121,13 @@
#define CHIP_DEVICE_CONFIG_BLE_SLOW_ADVERTISING_INTERVAL_MAX CONFIG_BLE_SLOW_ADVERTISING_INTERVAL_MAX
#define CHIP_DEVICE_CONFIG_CHIPOBLE_SINGLE_CONNECTION CONFIG_CHIPOBLE_SINGLE_CONNECTION
#define CHIP_DEVICE_CONFIG_CHIPOBLE_ENABLE_ADVERTISING_AUTOSTART CONFIG_CHIPOBLE_ENABLE_ADVERTISING_AUTOSTART
#define CHIP_DEVICE_CONFIG_ENABLE_TEST_SETUP_PARAMS CONFIG_ENABLE_TEST_SETUP_PARAMS

#ifdef CONFIG_ENABLE_TEST_SETUP_PARAMS
#define CHIP_DEVICE_CONFIG_ENABLE_TEST_SETUP_PARAMS 1
#else
#define CHIP_DEVICE_CONFIG_ENABLE_TEST_SETUP_PARAMS 0
#endif // CONFIG_ENABLE_TEST_SETUP_PARAMS

#define CHIP_DEVICE_CONFIG_TEST_SERIAL_NUMBER CONFIG_USE_TEST_SERIAL_NUMBER

#ifdef CONFIG_ENABLE_THREAD_TELEMETRY
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